Assessing the Limitations of Activation Clipping for Fault Mitigation in Vision and Language Transformers
Talk, 27th IEEE Latin-American Test Symposium, Florianópolis, Santa Catarina, Brazil
Talk, 27th IEEE Latin-American Test Symposium, Florianópolis, Santa Catarina, Brazil
Talk, BITFLIP, ECW2025, Rennes, France
Poster, IEEE NSREC 2025, Nashville, USA